Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determinedby polarized x-ray spectroscopy and Seebeck measurements

نویسندگان

  • Martin Magnuson
  • Maurizio Mattesini
  • Ngo Van Nong
  • Per Eklund
  • Lars Hultman
چکیده

Martin Magnuson,1 Maurizio Mattesini,2,3 Ngo Van Nong,4 Per Eklund,1 and Lars Hultman1 1Thin Film Physics Division, Department of Physics, Chemistry and Biology, IFM, Linköping University, SE-58183 Linköping, Sweden 2Departamento de Fı́sica de la Tierra, Astronomı́a y Astrofı́sica I, Universidad Complutense de Madrid, Madrid, E-28040, Spain 3Instituto de Geociencias (CSIC-UCM), Facultad de CC. Fı́sicas, E-28040 Madrid, Spain 4Department of Energy Conversion and Storage, Technical University of Denmark, Risö Campus, 4000 Roskilde, Denmark (Received 29 May 2011; revised manuscript received 16 February 2012; published 22 May 2012)

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تاریخ انتشار 2012